23 July 1993 Double spectral modulation profilometry: a solution to the problem of stationary phase
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Proceedings Volume 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology; 1983AU (1993) https://doi.org/10.1117/12.2308809
Event: 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1993, Budapest, Hungary
Abstract
The measurement of three-dimensional object shapes plays an important role in machine vision solid modelling, automatic manufacturing, and other industrial applications /1/. Well- known optical methods for 3D-shape inspection are moire-technique /2/ and contouring /3/. Unfortunately, they lack as a rule on the fact of measuring only one coordinate, i.e. the height above a reference surface. The other coordinates in the reference plane have to be determined using the pixeldistance of the observing ccd-camera or by other means. Here, we demonstrate a real 3D-coordinate measuring system using fringe projection techni- ques where the scale of coordinates is given by the illumination-structures. This method has the advantage that the aberration of the observing system and the depth-dependent imaging scale have no influence on the measurement of coordinates. Moreover, the measurements are independent of the position of the camera with respect to the object under test.
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A. L. Guerrero, "Double spectral modulation profilometry: a solution to the problem of stationary phase", Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1983AU (23 July 1993); doi: 10.1117/12.2308809; https://doi.org/10.1117/12.2308809
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