23 July 1993 Statistical assessments for optical thickness irregularities of an uncoated compact disk
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Proceedings Volume 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology; 1983AY (1993) https://doi.org/10.1117/12.2308813
Event: 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1993, Budapest, Hungary
Abstract
A new technique for automated profilometry has been proposed. It is is based on the Fourier-transform fringe analysis of spatio-temporal specklegrams produced by a wavelength-shift interferometer using a laser diode as a frequency-tunable light source. Unlike conventional moire techniques, the proposed technique allows the objects to have discontinuous height steps and/or surfaces spatially isolated from each other.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. Tanaka, S. Tanaka, } "Statistical assessments for optical thickness irregularities of an uncoated compact disk", Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1983AY (23 July 1993); doi: 10.1117/12.2308813; https://doi.org/10.1117/12.2308813
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