23 July 1993 Application of the diffraction pattern's deformations for the measuring devices
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Proceedings Volume 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology; 1983BO (1993) https://doi.org/10.1117/12.2308839
Event: 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1993, Budapest, Hungary
Abstract
Michelson visibility is used to identify areas of correct focusing in stacks of images with progressive severe defocusing. It is found that visibility is a maximum when focusing is correct. An image with partially corrected defocusing is constructed using this criterion.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexander A. Arefiev, "Application of the diffraction pattern's deformations for the measuring devices", Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1983BO (23 July 1993); doi: 10.1117/12.2308839; https://doi.org/10.1117/12.2308839
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