23 July 1993 Optical nondestructive inspection as a part of modern high technologies
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Proceedings Volume 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology; 1983CC (1993) https://doi.org/10.1117/12.2308863
Event: 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1993, Budapest, Hungary
Abstract
Raman scattering was employed to study the thermal crystallization of plasma deposited a-Si:H. The crystalliza- tion, experiments were carried out at 850 °C for different times. It was established that at the used temperature the crystallization proceeded in the first few minutes. The amount and size of microcrystallites did not change with the prolonged annealing.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
V. S. Rondarev, "Optical nondestructive inspection as a part of modern high technologies", Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1983CC (23 July 1993); doi: 10.1117/12.2308863; https://doi.org/10.1117/12.2308863
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