17 December 1993 Computer vision methods for the three-dimensional measurement of manufactured parts
Author Affiliations +
Proceedings Volume 1989, Computer Vision for Industry; (1993) https://doi.org/10.1117/12.164876
Event: Electronic Imaging Device Engineering, 1993, Munich, Germany
This paper describes a non-contact system for surface shape measurement of manufactured parts. The technique consists of a coherent optical system combined with powerful parallel processing hardware, thus allowing rapid inspection rates to be realized. A `structured lighting' system is employed involving the projection of a multi-stripe fringe pattern onto the object surface thus enabling 3D data to be obtained. Phase measuring techniques are applied in order to increase accuracy and resolution. A comparison is made between two different phase measuring methodologies. These techniques require computationally intensive algorithms and processing of large amounts of image data. Image processing hardware should be fast enough to achieve results within a reasonable time scale. A parallel image processing system has been designed for such applications based on the Texas Instruments digital signal processor type TMS320C40. The system is based on MIMD message passing architecture and uses an EISA bus for the host interface. The issues of speed of data acquisition and processing, reliability and robustness of the technique and accuracy are discussed.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
John T. Atkinson, John T. Atkinson, Clifford Allan Hobson, Clifford Allan Hobson, Shirish P. Kshirsagar, Shirish P. Kshirsagar, Francis Lilley, Francis Lilley, Jeremy David Pearson, Jeremy David Pearson, } "Computer vision methods for the three-dimensional measurement of manufactured parts", Proc. SPIE 1989, Computer Vision for Industry, (17 December 1993); doi: 10.1117/12.164876; https://doi.org/10.1117/12.164876


Intermediate and low-level image processing with M3
Proceedings of SPIE (October 29 1997)
Three-Dimensional Imaging And Applications
Proceedings of SPIE (March 26 1987)
Optical measurement of solder bonds on printed circuit boards
Proceedings of SPIE (December 11 1994)
FFT look-up table for image processing
Proceedings of SPIE (October 31 1992)
Laser Imaging Systems For Computer Vision
Proceedings of SPIE (May 17 1989)

Back to Top