17 December 1993 Evaluation of machine vision systems for six-sigma environment
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Proceedings Volume 1989, Computer Vision for Industry; (1993) https://doi.org/10.1117/12.164890
Event: Electronic Imaging Device Engineering, 1993, Munich, Germany
Abstract
Machine vision systems are often used in gaging applications. Analysis of the measurement system is important to determine if the measurement process is adequate to measure the part- to-part variability in the manufacturing process and if the system can be implemented as a reject station. The paper provides the principles of measurement system analysis and the principles of Three-Sigma and Six-Sigma quality control. This paper introduces formulas for evaluating the additional yield loss due to rejection of good parts in Three-Sigma and Six- Sigma process design as function of the measurement system resolution. At the end of the paper we will discuss gage resolution requirements for Three-Sigma and Six-Sigma quality control.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peter Cencik, Peter Cencik, "Evaluation of machine vision systems for six-sigma environment", Proc. SPIE 1989, Computer Vision for Industry, (17 December 1993); doi: 10.1117/12.164890; https://doi.org/10.1117/12.164890
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