PROCEEDINGS VOLUME 1993
SPIE'S 1993 INTERNATIONAL SYMPOSIUM ON OPTICS, IMAGING, AND INSTRUMENTATION | 11-16 JULY 1993
Quality and Reliability for Optical Systems
IN THIS VOLUME

1 Sessions, 14 Papers, 0 Presentations
Section  (14)
SPIE'S 1993 INTERNATIONAL SYMPOSIUM ON OPTICS, IMAGING, AND INSTRUMENTATION
11-16 July 1993
San Diego, CA, United States
Section
Proc. SPIE 1993, Role of quality assurance in space-based optical systems, 0000 (7 December 1993); doi: 10.1117/12.164973
Proc. SPIE 1993, Quality-assurance demands and realization for thin-walled mirror blanks made of ZERODUR for the AXAF project, 0000 (7 December 1993); doi: 10.1117/12.164981
Proc. SPIE 1993, AXAF optical quality ensurance via the crosscheck process, 0000 (7 December 1993); doi: 10.1117/12.164982
Proc. SPIE 1993, Finishing and proof testing of windows for manned space craft, 0000 (7 December 1993); doi: 10.1117/12.164983
Proc. SPIE 1993, ISO environmental testing and reliability standards for optics, 0000 (7 December 1993); doi: 10.1117/12.164984
Proc. SPIE 1993, Status of bidirectional reflectance distribution function calibration standards development, 0000 (7 December 1993); doi: 10.1117/12.164985
Proc. SPIE 1993, Surface specification in terms of system performance, 0000 (7 December 1993); doi: 10.1117/12.164986
Proc. SPIE 1993, Step-height standard for surface-profiler calibration, 0000 (7 December 1993); doi: 10.1117/12.164974
Proc. SPIE 1993, Design of instruments for the measurement of large-size anamorphic optical components, 0000 (7 December 1993); doi: 10.1117/12.164975
Proc. SPIE 1993, Null test for null correctors: error analysis, 0000 (7 December 1993); doi: 10.1117/12.164976
Proc. SPIE 1993, Tolerancing of Wide-Field/Planetary Camera-II, 0000 (7 December 1993); doi: 10.1117/12.164977
Proc. SPIE 1993, Dimensional stability of high-purity Invar 36, 0000 (7 December 1993); doi: 10.1117/12.164978
Proc. SPIE 1993, Durability and reliability of lightweight composite mirrors for space optical systems, 0000 (7 December 1993); doi: 10.1117/12.164979
Proc. SPIE 1993, Employment of design of experiment for optimized development of thin film coatings, 0000 (7 December 1993); doi: 10.1117/12.164980
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