PROCEEDINGS VOLUME 1995
SPIE'S 1993 INTERNATIONAL SYMPOSIUM ON OPTICS, IMAGING, AND INSTRUMENTATION | 11-16 JULY 1993
Optical Scattering: Applications, Measurement, and Theory II
Editor(s): John C. Stover
IN THIS VOLUME

4 Sessions, 27 Papers, 0 Presentations
SPIE'S 1993 INTERNATIONAL SYMPOSIUM ON OPTICS, IMAGING, AND INSTRUMENTATION
11-16 July 1993
San Diego, CA, United States
Analysis and Theory
Proc. SPIE 1995, Windowing effects on light scattering by sinusoidal surfaces, 0000 (1 December 1993); https://doi.org/10.1117/12.162640
Proc. SPIE 1995, Wavelength dependence of scatter from O-50 grade Beryllium mirrors, 0000 (1 December 1993); https://doi.org/10.1117/12.162649
Proc. SPIE 1995, Scattering signatures of isolated surface features, 0000 (1 December 1993); https://doi.org/10.1117/12.162657
Proc. SPIE 1995, Light scattering and distribution model for scintillation cameras, 0000 (1 December 1993); https://doi.org/10.1117/12.162662
Proc. SPIE 1995, Diffuse reflection from smooth dielectric surfaces, 0000 (1 December 1993); https://doi.org/10.1117/12.162663
Proc. SPIE 1995, Plane-wave expansions methods applied to the calculation of the optical scattering by one-dimensional randomly rough dielectric surfaces, 0000 (1 December 1993); https://doi.org/10.1117/12.162664
Proc. SPIE 1995, Extracting the scattering coefficient of sea water from the return time signal of ocean lidar, 0000 (1 December 1993); https://doi.org/10.1117/12.162665
Instruments and Techniques
Proc. SPIE 1995, Preparing samples for scattering measurements--a cleaning study: part 2, 0000 (1 December 1993); https://doi.org/10.1117/12.162666
Proc. SPIE 1995, Design review of an instrument to map low-level hydrocarbon contamination, 0000 (1 December 1993); https://doi.org/10.1117/12.162641
Proc. SPIE 1995, Measurement of hemispherical directional reflectance in the infrared, 0000 (1 December 1993); https://doi.org/10.1117/12.162642
Proc. SPIE 1995, Design review of a high-accuracy UV to near-IR scatterometer, 0000 (1 December 1993); https://doi.org/10.1117/12.162643
Proc. SPIE 1995, Design review of a unique laser monostatic bidirectional reflectometer, 0000 (1 December 1993); https://doi.org/10.1117/12.162644
Proc. SPIE 1995, Sources of error in spectroscopic low-level integrated light scattering measurements, 0000 (1 December 1993); https://doi.org/10.1117/12.162645
Surface Scatter
Proc. SPIE 1995, Real-time detection of surface damage by direct assessment of the BRDF, 0000 (1 December 1993); https://doi.org/10.1117/12.162646
Proc. SPIE 1995, Microtopography investigations of optical surfaces and thin films by light scattering, optical profilometry, and atomic force microscopy, 0000 (1 December 1993); https://doi.org/10.1117/12.162647
Proc. SPIE 1995, Characterization of curved plastic surfaces, 0000 (1 December 1993); https://doi.org/10.1117/12.162648
Proc. SPIE 1995, Reflection, scattering, and polarization from a very rough black surface, 0000 (1 December 1993); https://doi.org/10.1117/12.162650
Proc. SPIE 1995, Very high angular selectivity system for measuring backscatter from rough surfaces, 0000 (1 December 1993); https://doi.org/10.1117/12.162651
Proc. SPIE 1995, Scattering properties of very rough surfaces: application to brightness measurement of common objects, 0000 (1 December 1993); https://doi.org/10.1117/12.162652
Scatter Measurements
Proc. SPIE 1995, High-temperature optical scatter characteristics of CVD diamond and natural type IIa diamond, 0000 (1 December 1993); https://doi.org/10.1117/12.162653
Proc. SPIE 1995, Wavelength scaling investigation of several materials, 0000 (1 December 1993); https://doi.org/10.1117/12.162654
Proc. SPIE 1995, Mueller matrix measurements of several optical components, 0000 (1 December 1993); https://doi.org/10.1117/12.162655
Proc. SPIE 1995, Bulk scatter measurements in fused silica at two wavelengths: a comparison with Rayleigh scatter theory, 0000 (1 December 1993); https://doi.org/10.1117/12.162656
Proc. SPIE 1995, BRDF round robin test of ASTM E1392, 0000 (1 December 1993); https://doi.org/10.1117/12.162658
Proc. SPIE 1995, Experimental scattering investigations and radiative transfer calculations of large arbitrarily shaped absorbing particles, 0000 (1 December 1993); https://doi.org/10.1117/12.162659
Instruments and Techniques
Proc. SPIE 1995, New generation high-speed high-resolution hemispherical scatterometer, 0000 (1 December 1993); https://doi.org/10.1117/12.162660
Surface Scatter
Proc. SPIE 1995, Step-height standard for surface-profiler calibration, 0000 (1 December 1993); https://doi.org/10.1117/12.162661
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