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Plane-wave expansions methods applied to the calculation of the optical scattering by one-dimensional randomly rough dielectric surfaces
Microtopography investigations of optical surfaces and thin films by light scattering, optical profilometry, and atomic-force microscopy
Scattering properties of very rough surfaces: application to brightness measurement of common objects
Bulk scatter measurements in fused silica at two wavelengths: a comparison with Rayleigh scatter theory
Experimental scattering investigations and radiative transfer calculations of large arbitrarily shaped absorbing particles