1 December 1993 Bulk scatter measurements in fused silica at two wavelengths: a comparison with Rayleigh scatter theory
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Abstract
Angle resolved scattering from bulk fused silica substrates has been measured at .442 micrometers and .633 micrometers . The angle dependent scatter pattern and wavelength dependence are compared to Rayleigh scatter theory. The measured bulk scatter data is applied to the measurement of fused silica substrate total scatter and the resulting measurement limitations imposed by bulk scatter.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James Paul Black, James Paul Black, Kirt C. Hickman, Kirt C. Hickman, } "Bulk scatter measurements in fused silica at two wavelengths: a comparison with Rayleigh scatter theory", Proc. SPIE 1995, Optical Scattering: Applications, Measurement, and Theory II, (1 December 1993); doi: 10.1117/12.162656; https://doi.org/10.1117/12.162656
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