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1 December 1993 Mueller matrix measurements of several optical components
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Abstract
The Stokes/Mueller approach provides complete characterization of sample induced polarization changes to both specular and scattered light that is reflected or transmitted from optical components. Ellipsometry is a subset of this more complete approach to polarization analysis. In this paper, Mueller matrices of several samples are found and compared to the matrix of ideal elements. Samples include optical mirrors that scatter both topographically and non-topographically, waveplates, and optical windows.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
John C. Stover, Marvin L. Bernt, Tod F. Schiff, and Brett D. Swimley "Mueller matrix measurements of several optical components", Proc. SPIE 1995, Optical Scattering: Applications, Measurement, and Theory II, (1 December 1993); https://doi.org/10.1117/12.162655
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