Characterization of curved plastic surfaces

Qianyan Xie; Donald G. Fesko

doi:10.1117/12.162648

1 December 1993 Characterization of curved plastic surfaces

Qianyan Xie, Donald G. Fesko

Proceedings Volume 1995, Optical Scattering: Applications, Measurement, and Theory II; (1993) https://doi.org/10.1117/12.162648
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

This paper presents the surface roughness characteristics obtained from three different instruments: a mechanical stylus profilometer, a split-beam detection optical profilometer, and an interference microscope. Experimental data for both molded and coated plastic reflector surfaces using different measuring techniques are reviewed and the deficiencies in relating the various methods are clearly illustrated.

Citation Download Citation

Qianyan Xie and Donald G. Fesko "Characterization of curved plastic surfaces", Proc. SPIE 1995, Optical Scattering: Applications, Measurement, and Theory II, (1 December 1993); https://doi.org/10.1117/12.162648

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