Translator Disclaimer
27 September 1993 Test efficiency: a simple parameter for comparing adhesive fracture tests for adhesion measurement
Author Affiliations +
There is no online version at this time. The PDF is only available to people who have bought the paper or have a subscription.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yeh-Hung Lai and David A. Dillard "Test efficiency: a simple parameter for comparing adhesive fracture tests for adhesion measurement", Proc. SPIE 1999, Adhesives Engineering, (27 September 1993); https://doi.org/10.1117/12.158602
PROCEEDINGS
10 PAGES


SHARE
Advertisement
Advertisement
Back to Top