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New method of improving the sensitivity of real-time measuring of the surface roughness of workpieces
Propagation methods for the analysis of bistable devices and spatial light modulators based on nonlinear molecular media
Optical system design of the Voltage ImagingTM optical subsystem (VIOS) in AMLCD in-process test system (IPT)
Caustic analysis based on higher-order asymptotic stress field of mode II crack tip of nonuniform propagation
Fabrication of planar gradient index cylindrical microlenses and their application to laser diode collimation
Control of gradient index profile for gradient index glasses of macro size and large Δn for a varifocal slide projector lens