25 November 1993 Optical system design of the Voltage ImagingTM optical subsystem (VIOS) in AMLCD in-process test system (IPT)
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Abstract
Photon Dynamics' IPT system provides high throughput and excellent voltage measurement sensitivity on an AMLCD panel. It is based upon an electro-optical technology to measure the voltage stores on an LCD pixel of an AMLCD active plate. This paper discusses the system performance requirements. From these we derive the optical subsystem requirements. The optical design form and its performance are presented. The current system status, system design issues, and the future improvements also are discussed.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ying-Moh Liu, Ying-Moh Liu, David Yushan Fong, David Yushan Fong, "Optical system design of the Voltage ImagingTM optical subsystem (VIOS) in AMLCD in-process test system (IPT)", Proc. SPIE 2000, Current Developments in Optical Design and Optical Engineering III, (25 November 1993); doi: 10.1117/12.163650; https://doi.org/10.1117/12.163650
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