25 November 1993 Room-temperature functional test station for a cryogenically cooled far-infrared sensor
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A room temperature functional test station for a cryogenically cooled far infrared (IR) sensor was designed to provide a reduced background yet allow the sensor to be evaluated in standard laboratory surroundings. The functional test station (FTS) included a blackbody source, 11.5 inch clear aperture eccentric pupil (`off-axis') parabolic mirror, and sensor mount assembled onto a vibration isolated optical table and covered by a class 100 laminar flow bench. The emissivity contribution of the test station to the total background of the test station and sensor system was less than 30%. While atmospheric effects were significant, they were not detrimental to functional testing. The functional test station allowed optimization of sensor focus as well as integration of analog signal processing and object digital signal processing. This was accomplished without the attendant cost and complexity of a cryo-vacuum facility.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jonathon W. Book, Jonathon W. Book, } "Room-temperature functional test station for a cryogenically cooled far-infrared sensor", Proc. SPIE 2000, Current Developments in Optical Design and Optical Engineering III, (25 November 1993); doi: 10.1117/12.163640; https://doi.org/10.1117/12.163640

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