PROCEEDINGS VOLUME 2003
SPIE'S 1993 INTERNATIONAL SYMPOSIUM ON OPTICS, IMAGING, AND INSTRUMENTATION | 11-16 JULY 1993
Interferometry VI: Techniques and Analysis
IN THIS VOLUME

5 Sessions, 49 Papers, 0 Presentations
Analysis I  (9)
Analysis II  (18)
SPIE'S 1993 INTERNATIONAL SYMPOSIUM ON OPTICS, IMAGING, AND INSTRUMENTATION
11-16 July 1993
San Diego, CA, United States
Surface Figures and Roughness
Proc. SPIE 2003, Laser interferometry-based characterization of surfaces by data-dependent systems, 0000 (10 December 1993); doi: 10.1117/12.165451
Proc. SPIE 2003, Sinusoidal phase-modulating Fizeau interferometer using phase-conjugate wave, 0000 (10 December 1993); doi: 10.1117/12.165461
Proc. SPIE 2003, In-position optical surface measurement for x-ray projection lithography optics: theory and simulation, 0000 (10 December 1993); doi: 10.1117/12.165471
Proc. SPIE 2003, Microtopographic inspection of surfaces: a comparison between moire, contrived lighting, and discreet triangulation methods, 0000 (10 December 1993); doi: 10.1117/12.165479
Special Techniques
Proc. SPIE 2003, Heterodyne signal processing using stimulated Brillouin scattering in optical fiber ring resonators, 0000 (10 December 1993); doi: 10.1117/12.165486
Proc. SPIE 2003, Polarimetric technique for fiber optic sensors, 0000 (10 December 1993); doi: 10.1117/12.165487
Proc. SPIE 2003, One-way image transmission via distorting media and real-time interferometry in photorefractive crystal, 0000 (10 December 1993); doi: 10.1117/12.165488
Proc. SPIE 2003, Optical metrology used to sense and control a segmented optical system, 0000 (10 December 1993); doi: 10.1117/12.165489
Proc. SPIE 2003, Phase stepping: application to the automated determination of isostatics in photoelasticimetry, 0000 (10 December 1993); doi: 10.1117/12.165441
Proc. SPIE 2003, Development of an active-optics system for 27-inch thin mirror, 0000 (10 December 1993); doi: 10.1117/12.165442
Proc. SPIE 2003, Autodetection of radial gratings with digital receiving mode, 0000 (10 December 1993); doi: 10.1117/12.165443
ESPI, Holographic, and Moire Interferometry
Proc. SPIE 2003, Electronic speckle tracking, 0000 (10 December 1993); doi: 10.1117/12.165444
Proc. SPIE 2003, Quantitative evaluation of speckle correlation fringes from a flat rotating specimen, 0000 (10 December 1993); doi: 10.1117/12.165445
Proc. SPIE 2003, New technique of three-dimensional dynamic measurements based on multi-pulsed holographic interferometry, 0000 (10 December 1993); doi: 10.1117/12.165446
Proc. SPIE 2003, Algorithm for calculating phase from ESPI addition fringes, 0000 (10 December 1993); doi: 10.1117/12.165447
Proc. SPIE 2003, Calibration of a phase-shifting moire interferometer, 0000 (10 December 1993); doi: 10.1117/12.165448
Proc. SPIE 2003, Phase stepping: application to high-resolution moire, 0000 (10 December 1993); doi: 10.1117/12.165449
Proc. SPIE 2003, Calculation of the contrast of moire deflectometric fringes, 0000 (10 December 1993); doi: 10.1117/12.165450
Proc. SPIE 2003, Effects of detector characteristics on the phase measurement in quasi-heterodyne reference-beam ESPI, 0000 (10 December 1993); doi: 10.1117/12.165452
Proc. SPIE 2003, Accuracy analysis to quasi-heterodyne ESPI: indirect method, 0000 (10 December 1993); doi: 10.1117/12.165453
Analysis I
Proc. SPIE 2003, Beyond fringe analysis, 0000 (10 December 1993); doi: 10.1117/12.165454
Proc. SPIE 2003, Mechanism for surface fitting of interferometric slope data, 0000 (10 December 1993); doi: 10.1117/12.165455
Proc. SPIE 2003, Application of an automatic phase unwrapping method for the quantitative extraction of information from high-resolution interferometric and photo-elastic data, 0000 (10 December 1993); doi: 10.1117/12.165456
Proc. SPIE 2003, Holographic fringe interpretation by FFT and carrier-fringe method, 0000 (10 December 1993); doi: 10.1117/12.165457
Proc. SPIE 2003, Simple and effective phase unwrapping technique, 0000 (10 December 1993); doi: 10.1117/12.165458
Proc. SPIE 2003, Real-time video rate phase processor, 0000 (10 December 1993); doi: 10.1117/12.165459
Proc. SPIE 2003, Model-based compensation of distortions in 3D shape measurement, 0000 (10 December 1993); doi: 10.1117/12.165460
Proc. SPIE 2003, Focal length measurements with a three-grating system, 0000 (10 December 1993); doi: 10.1117/12.165462
Proc. SPIE 2003, Accuracy analysis of multiaperture overlap-scanning technique (MAOST), 0000 (10 December 1993); doi: 10.1117/12.165463
Analysis II
Proc. SPIE 2003, Phase shifting, spatial Fourier transform, and fringe tracking analysis of hypersonic flow field holographic interferograms, 0000 (10 December 1993); doi: 10.1117/12.165464
Proc. SPIE 2003, Evaluation of ESPI phase images with regional discontinuities, 0000 (10 December 1993); doi: 10.1117/12.165465
Proc. SPIE 2003, New amplitude weighted filtering technique for noise reduction in images with 2pi phase jumps, 0000 (10 December 1993); doi: 10.1117/12.165466
Proc. SPIE 2003, Application of nonalgorithmic techniques to the analysis of optical Fourier transforms for quality evaluation of small objects, 0000 (10 December 1993); doi: 10.1117/12.165467
Proc. SPIE 2003, Phase unwrapping by least squares error minimization of phase curvature, 0000 (10 December 1993); doi: 10.1117/12.165468
Proc. SPIE 2003, Gaussian threshold for high-fidelity of digital wavefront reconstruction, 0000 (10 December 1993); doi: 10.1117/12.165469
Proc. SPIE 2003, New algorithm on phase-shifting interferometry: the overlapping averaging 4-frame algorithm, 0000 (10 December 1993); doi: 10.1117/12.165470
ESPI, Holographic, and Moire Interferometry
Proc. SPIE 2003, Adaptive holographic interferometry for 2D vibrational modes display, 0000 (10 December 1993); doi: 10.1117/12.165472
Analysis II
Proc. SPIE 2003, Large-aperture high-accuracy phase-shifting digital flat interferometer, 0000 (10 December 1993); doi: 10.1117/12.165473
Proc. SPIE 2003, Optical fiber holographic speckle interferometry, 0000 (10 December 1993); doi: 10.1117/12.165474
Proc. SPIE 2003, New method of dynamic rotation rate test, 0000 (10 December 1993); doi: 10.1117/12.165475
Proc. SPIE 2003, Study of measuring rotating angle with double-frequency laser and wedge-plate interference, 0000 (10 December 1993); doi: 10.1117/12.165476
Proc. SPIE 2003, New technique for testing large optical flat, 0000 (10 December 1993); doi: 10.1117/12.165477
Proc. SPIE 2003, Ronchi test using overlapping averaging 4-frame algorithm, 0000 (10 December 1993); doi: 10.1117/12.165478
Proc. SPIE 2003, New measurement of metal surface roughness rq and sm by using dynamical speckle, 0000 (10 December 1993); doi: 10.1117/12.165480
Proc. SPIE 2003, New optical head and system of ESPI, 0000 (10 December 1993); doi: 10.1117/12.165481
Proc. SPIE 2003, Electronic speckle carrier shearography for automated deformation measurement, 0000 (10 December 1993); doi: 10.1117/12.165482
Proc. SPIE 2003, Statistical theory for quasi-heterodyne ESPI with reference beam, 0000 (10 December 1993); doi: 10.1117/12.165483
Proc. SPIE 2003, New algorithm for compensating phase-shifting error, 0000 (10 December 1993); doi: 10.1117/12.165484
ESPI, Holographic, and Moire Interferometry
Proc. SPIE 2003, Electronic speckle techniques in noisy environments, 0000 (10 December 1993); doi: 10.1117/12.165485
Back to Top