Paper
10 December 1993 Application of nonalgorithmic techniques to the analysis of optical Fourier transforms for quality evaluation of small objects
David J. Search, Clifford Allan Hobson, John T. Atkinson, A. Kenneth Porter
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Abstract
The feasibility of using diffraction pattern analysis for the quality assessment of small components, with a specific application aimed at electronic components, is discussed. An electro-optical system for the capture of reflected diffraction patterns is presented. Preliminary simulation results for simple faults have been obtained and are used to illustrate the described feature vector and neural network classifier.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David J. Search, Clifford Allan Hobson, John T. Atkinson, and A. Kenneth Porter "Application of nonalgorithmic techniques to the analysis of optical Fourier transforms for quality evaluation of small objects", Proc. SPIE 2003, Interferometry VI: Techniques and Analysis, (10 December 1993); https://doi.org/10.1117/12.165467
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KEYWORDS
Diffraction

Lead

Inspection

Fourier transforms

Neural networks

Charge-coupled devices

Transmittance

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