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19 November 1993 High-resolution monolithic delay-line readout techniques for two-dimensional microchannel plate detectors
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Developments in high resolution double delay line (DDL) and cross delay line image readouts for applications in UV and soft X-ray imaging and spectroscopy are described. Our current DDL's achieve approximately equals 15 micrometers X 25 micrometers FWHM over 65 X 15 mm (> 4000 X 500 resolution elements) with counting rates of > 105 (10% dead time), good linearity (+/- approximately equals 1 resolution element) and high stability. We have also developed 65 mm X 15 mm multilayer cross delay line anodes with external serpentine delay lines which currently give approximately equals 20 micrometers FWHM resolution in both axes, with good linearity (approximately equals 30 micrometers ) and flat field performance. State of the art analog to digital converter and digital signal processor technology have been employed to develop novel event position encoding electronics with high count rate capability (2 X 105 events sec-1).
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Oswald H. W. Siegmund, Mark A. Gummin, Joseph M. Stock, Daniel R. Marsh, Richard Raffanti, and Jeffrey S. Hull "High-resolution monolithic delay-line readout techniques for two-dimensional microchannel plate detectors", Proc. SPIE 2006, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IV, (19 November 1993);


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