Particle background in CCD detectors

David H. Lumb

doi:10.1117/12.162843

19 November 1993 Particle background in CCD detectors

David H. Lumb

Proceedings Volume 2006, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IV; (1993) https://doi.org/10.1117/12.162843
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

Monte Carlo simulations of charged particle events in CCDs are described. Efficient background rejection can be obtained by a combination of energy veto and event morphology censoring. The data are compared with in-flight measurements taken during a sounding rocket flight of a prototype detector. Implications for future missions are discussed. It is shown that the external charged particle background may be small enough that other effects such as locally induced radioactivity and soft electron contamination become important factors.

Citation Download Citation

David H. Lumb "Particle background in CCD detectors", Proc. SPIE 2006, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IV, (19 November 1993); https://doi.org/10.1117/12.162843

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