19 November 1993 Performance of back-illuminated Tektronix CCDs in the extreme ultraviolet
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Abstract
The quantum efficiency (QE) and flat field characteristics of back-illuminated 1024 X 1024 Tektronix CCDs have been measured in the extreme ultraviolet (EUV) between 44 and 1216 angstroms. These CCDs have been fabricated for the focal plane detector of the Extreme-ultraviolet Imaging Telescope (EIT) on the Solar and Heliospheric Observing spacecraft. The back-side surface of the EIT CCDs have been specially processed to enhance and stabilize the EUV QE. All requirements for QE are met by these devices, although a poorly understood variation of QE with temperature will complicate data analysis.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Daniel Moses, J. Daniel Moses, Russell A. Howard, Russell A. Howard, Dennis Wang, Dennis Wang, Richard C. Catura, Richard C. Catura, James R. Lemen, James R. Lemen, Lawrence Shing, Lawrence Shing, Robert A. Stern, Robert A. Stern, Jean-Francois E. Hochedez, Jean-Francois E. Hochedez, Jean-Pierre Delaboudiniere, Jean-Pierre Delaboudiniere, } "Performance of back-illuminated Tektronix CCDs in the extreme ultraviolet", Proc. SPIE 2006, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IV, (19 November 1993); doi: 10.1117/12.162837; https://doi.org/10.1117/12.162837
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