19 November 1993 Soft x-ray and EUV efficiencies of CCDs
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Abstract
We present a compilation of CCD quantum efficiency measurements made at soft x-ray and extreme ultraviolet wavelengths. The measurements include CCDs of varying architecture and have been obtained from a number of projects over the last several years.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Richard C. Catura, Richard C. Catura, Lawrence Shing, Lawrence Shing, "Soft x-ray and EUV efficiencies of CCDs", Proc. SPIE 2006, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IV, (19 November 1993); doi: 10.1117/12.162841; https://doi.org/10.1117/12.162841
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