PROCEEDINGS VOLUME 2009
SPIE'S 1993 INTERNATIONAL SYMPOSIUM ON OPTICS, IMAGING, AND INSTRUMENTATION | 11-16 JULY 1993
X-Ray Detector Physics and Applications II
Editor(s): Victor J. Orphan
IN THIS VOLUME

5 Sessions, 27 Papers, 0 Presentations
Applications  (6)
SPIE'S 1993 INTERNATIONAL SYMPOSIUM ON OPTICS, IMAGING, AND INSTRUMENTATION
11-16 July 1993
San Diego, CA, United States
Imaging X-Ray Detectors
Proc. SPIE 2009, Properties of 100-mm X 100-mm triple stacks of microchannel plates used in a sealed detector for x-ray crystallography, 0000 (16 December 1993); doi: 10.1117/12.164735
Proc. SPIE 2009, Large-area scanning x-ray source to maximize contrast sensitivity by minimizing scatter detection, 0000 (16 December 1993); doi: 10.1117/12.164743
Proc. SPIE 2009, Vertically integrated electronic x-ray imager, 0000 (16 December 1993); doi: 10.1117/12.164750
Proc. SPIE 2009, Low-cost, high-resolution x-ray detector system for digital radiography and computed tomography, 0000 (16 December 1993); doi: 10.1117/12.164751
Proc. SPIE 2009, Electronic intraoral dental x-ray imaging system employing a direct-sensing CCD array, 0000 (16 December 1993); doi: 10.1117/12.164752
Proc. SPIE 2009, High-dynamic-range x-ray imager employing CdZnTe detector arrays, 0000 (16 December 1993); doi: 10.1117/12.164753
Poster Presentations
Proc. SPIE 2009, X-ray dosimetry with low-capacitance silicon detector, 0000 (16 December 1993); doi: 10.1117/12.164727
Soft X-Ray Detectors
Proc. SPIE 2009, X-ray image-conversion panel, 0000 (16 December 1993); doi: 10.1117/12.164728
Proc. SPIE 2009, Characterization of polycrystalline phosphors for area x-ray detectors, 0000 (16 December 1993); doi: 10.1117/12.164729
Proc. SPIE 2009, Thin-film NaI(Tl) scintillators for high-resolution large-area imaging of soft x rays, 0000 (16 December 1993); doi: 10.1117/12.164730
Proc. SPIE 2009, Sub-keV resolution detection with Cd1-xZnxTe detectors, 0000 (16 December 1993); doi: 10.1117/12.164731
Proc. SPIE 2009, CCD-based detector for crystallographic applications using laboratory x-ray sources, 0000 (16 December 1993); doi: 10.1117/12.164732
Proc. SPIE 2009, Performance of detectors for x-ray crystallography, 0000 (16 December 1993); doi: 10.1117/12.164733
Hard X-Ray Detectors
Proc. SPIE 2009, Real-time imaging detectors for portal imaging, 0000 (16 December 1993); doi: 10.1117/12.164734
Proc. SPIE 2009, Detector for high-energy photon backscatter, 0000 (16 December 1993); doi: 10.1117/12.164736
Proc. SPIE 2009, High-resolution digital radiography and three-dimensional computed tomography, 0000 (16 December 1993); doi: 10.1117/12.164737
Proc. SPIE 2009, Applications of CdTe detectors in x-ray imaging and metrology, 0000 (16 December 1993); doi: 10.1117/12.164738
Proc. SPIE 2009, High-resolution, near-real-time x-ray video imaging without image intensification, 0000 (16 December 1993); doi: 10.1117/12.164739
Applications
Proc. SPIE 2009, Advanced composites characterization with x-ray technologies, 0000 (16 December 1993); doi: 10.1117/12.164740
Proc. SPIE 2009, X-ray cone beam CT system calibration, 0000 (16 December 1993); doi: 10.1117/12.164741
Proc. SPIE 2009, Investigating damage fields in a particulate-composite material using real-time x-ray technique, 0000 (16 December 1993); doi: 10.1117/12.164742
Proc. SPIE 2009, Design and development of a fiber optic TDI CCD-based slot-scan digital mammography system, 0000 (16 December 1993); doi: 10.1117/12.164744
Proc. SPIE 2009, Digital microradiography and computed microtomography of NPR target particles, 0000 (16 December 1993); doi: 10.1117/12.164745
Proc. SPIE 2009, Low-cost high-resolution computed tomography, 0000 (16 December 1993); doi: 10.1117/12.164746
Poster Presentations
Proc. SPIE 2009, Long-term photocathode stability for microchannel plates in vacuum, 0000 (16 December 1993); doi: 10.1117/12.164747
Proc. SPIE 2009, MCP readout for the AXAF-I grating spectrometer, 0000 (16 December 1993); doi: 10.1117/12.164748
Proc. SPIE 2009, Recent advances in avalanche photodiode technology, 0000 (16 December 1993); doi: 10.1117/12.164749
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