Advanced composites characterization with x-ray technologies

George Y. Baaklini

doi:10.1117/12.164740

16 December 1993 Advanced composites characterization with x-ray technologies

George Y. Baaklini

Proceedings Volume 2009, X-Ray Detector Physics and Applications II; (1993) https://doi.org/10.1117/12.164740
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

Recognizing the critical need to advance new composites for the aeronautics and aerospace industries, we are focussing on advanced test methods that are vital to successful modeling and manufacturing of future generations of high temperature and durable composite materials. These newly developed composites are necessary to reduce propulsion cost and weight, to improve performance and reliability, and to address longer-term national strategic thrusts for sustaining global preeminence in high speed air transport and in high performance military aircraft.

Citation Download Citation

George Y. Baaklini "Advanced composites characterization with x-ray technologies", Proc. SPIE 2009, X-Ray Detector Physics and Applications II, (16 December 1993); https://doi.org/10.1117/12.164740

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