Applications of CdTe detectors in x-ray imaging and metrology

Marc Cuzin; Francis Glasser; Jean Lajzerowicz; Francoise Mathy; Loick Verger

doi:10.1117/12.164738

16 December 1993 Applications of CdTe detectors in x-ray imaging and metrology

Marc Cuzin, Francis Glasser, Jean Lajzerowicz, Francoise Mathy, Loick Verger

Proceedings Volume 2009, X-Ray Detector Physics and Applications II; (1993) https://doi.org/10.1117/12.164738
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

Operating as a photoconductor, the sensitivity and the impulse response of semi-insulating materials greatly depend on the excitation duration compared to electron and hole lifetimes. The characteristic of ohmic contact for these compounds is briefly discussed. Before developing picosecond measurements with integrated autocorrelation system, this paper explains high energy industrial tomographic application with large CdTe detectors (25 X 15 X 0.9 mm³) where spatial resolution, contrast, and wide dynamic are the main criteria. The excitation is typically microsecond(s) range. X-ray flash radiography with 10 ns burst is in an intermediate time domain where excitation is similar to electron life-time in cadmium telluride. In a laser fusion experiment the excitation is in the range of 50 ps and we develop for such high band devices photoconductive structures able to study very short x-ray emission. Thin polycrystalline MOCVD CdTe films with picosecond response are an alternative material suitable to perform optical correlation measurements of single shot pulses with a very large bandwidth (approximately 50 GHz).

Citation Download Citation

Marc Cuzin, Francis Glasser, Jean Lajzerowicz, Francoise Mathy, and Loick Verger "Applications of CdTe detectors in x-ray imaging and metrology", Proc. SPIE 2009, X-Ray Detector Physics and Applications II, (16 December 1993); https://doi.org/10.1117/12.164738

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