Paper
16 December 1993 Sub-keV resolution detection with Cd1-xZnxTe detectors
Jack F. Butler, Boris A. Apotovsky, A. Niemela, Heikki Sipila
Author Affiliations +
Abstract
Preliminary investigations were carried out to evaluate the resolution of Cd1-xZnxTe detectors at temperatures achievable with commercially available, low power Peltier refrigerators. Detectors were in the form of cubes, 2 mm on a side. They were tested using a preamplifier with optical feedback. The input FET was cooled along with the detectors. Resolutions of 409 eV and 326 eV were observed at the 5.9 keV line of Fe-55, at temperatures of -10 degree(s)C and -20 degree(s)C, respectively. Results indicate that a straightforward extension of this work will lead to resolutions well below 200 eV.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jack F. Butler, Boris A. Apotovsky, A. Niemela, and Heikki Sipila "Sub-keV resolution detection with Cd1-xZnxTe detectors", Proc. SPIE 2009, X-Ray Detector Physics and Applications II, (16 December 1993); https://doi.org/10.1117/12.164731
Lens.org Logo
CITATIONS
Cited by 33 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Sensors

Physics

X-ray detectors

Absorption

Semiconductors

Auroras

Crystals

Back to Top