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16 December 1993 X-ray dosimetry with low-capacitance silicon detector
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Abstract
The paper presents a low capacitance, low reverse current, suited for x-ray dosimetry at room temperature. The detector is a `drift chamber' type, with a transversal field collection of charge carriers. Based on the low noise performance of the detector and the first stage of electronics, a pocket size x-ray dose ratemeter is proposed, for the 10...60 keV energy range.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Doina N. Lazarovici, Cristian C. Lazarovici, Valerica Cimpoca, Radu Ruscu, Gh. Caragheorgheopol, Eugenia T. Halmagean, Marian N. Udrea-Spinea, S. Negru, A. Paunescu, and L. Staicu "X-ray dosimetry with low-capacitance silicon detector", Proc. SPIE 2009, X-Ray Detector Physics and Applications II, (16 December 1993); https://doi.org/10.1117/12.164727
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