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15 February 1994 Optical constant determination for x-ray materials
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Abstract
In the x-ray region of the spectrum, the optical constants of electron beam vacuum evaporated absorbing thin films are determined by measuring the reflectance at a number of angles of incidence. A method for calculating the optical constants through an iteration process of matching calculated and measured values of the reflectance is described.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michele M. Wilson, Jongmin Kim, Muamer Zukic, and Douglas G. Torr "Optical constant determination for x-ray materials", Proc. SPIE 2010, X-Ray and Ultraviolet Polarimetry, (15 February 1994); https://doi.org/10.1117/12.168583
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