Polarimetry with use of soft x-ray multilayers

Masaki Yamamoto

doi:10.1117/12.168575

15 February 1994 Polarimetry with use of soft x-ray multilayers

Masaki Yamamoto

Proceedings Volume 2010, X-Ray and Ultraviolet Polarimetry; (1994) https://doi.org/10.1117/12.168575
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

Soft x-ray polarimetry and ellipsometry have been made possible by the development of multilayer polarizers and phase shifters. In addition to the reflection type, a free-standing transmission type was also developed. With the polarizing elements, polarization of synchrotron radiation was measured, which revealed that the long axes of polarization ellipses were not horizontal but inclined. With a transmission phase shifter having 80.7 degree(s) phase shift, all normalized Stokes parameters of a partially polarized radiation from a laser produced plasma source were measured under a laboratory condition.

Citation Download Citation

Masaki Yamamoto "Polarimetry with use of soft x-ray multilayers", Proc. SPIE 2010, X-Ray and Ultraviolet Polarimetry, (15 February 1994); https://doi.org/10.1117/12.168575

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