15 February 1994 Polarization characteristics of synchrotron radiation by means of rotating-analyzer ellipsometry using soft x-ray multilayer
Author Affiliations +
Abstract
We have measured the states of polarization of synchrotron radiation at a few beamlines at the Photon Factory using multilayer mirrors as a polarizer or an analyzer. Remarkable differences between the observed data and the theoretical prediction have been found for bending magnet radiation. It has been also found that changes of the states of polarization, especially the inclination of the major axis of the polarization ellipses is caused by the beamline optics both for bending and undulator radiation.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hiroaki Kimura, Toyohiko Kinoshita, Shyouzi Suzuki, Tsuneaki Miyahara, Masaki Yamamoto, "Polarization characteristics of synchrotron radiation by means of rotating-analyzer ellipsometry using soft x-ray multilayer", Proc. SPIE 2010, X-Ray and Ultraviolet Polarimetry, (15 February 1994); doi: 10.1117/12.168588; https://doi.org/10.1117/12.168588
PROCEEDINGS
8 PAGES


SHARE
RELATED CONTENT

Multi Layers X-Ray Polarizers
Proceedings of SPIE (May 06 1985)
Polarimetry with use of soft x-ray multilayers
Proceedings of SPIE (February 15 1994)
XUV polarimeter for undulator radiation measurements
Proceedings of SPIE (November 01 1991)

Back to Top