Visit My Account to manage your email alerts.
Engineering qualification model of the SAX x-ray mirror unit: technical data and x-ray imaging characteristics
Determination of interfacial roughness correlation in W/C multilayer films: comparison using soft and hard x-ray diffraction
Imaging of laser-produced plasmas at wavelengths of 130 Å and 34 Å using a microscope with multilayer-coated mirrors
Transmittance measurements for a variety of x-ray/EUV filter materials and pinhole leak measurements utilizing a new visible light photometer system
Astronomical observations with normal incidence multilayer optics III: selection of multilayer bandpasses
Effects of heat load on the performance of a grating monochromator on an undulator beamline: simulation
Normal incidence imaging multilayer x-ray mirrors with the periods of nanometer and subnanometer scale