1 February 1994 High-resolution x-ray studies of an AXAF high-energy transmission grating
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Abstract
A triple axis X-ray diffractometer, designed and built at the Danish Space Research Institute, was used to make a high resolution study of the performance of a 2000 angstroms period, high energy X-ray transmission grating developed at MIT for one of the grating spectrometers on the Advanced X-ray Astrophysics Facility. Data was obtained at CuK(alpha )1 (8.048 keV) and, using single reflection asymmetric Si(044) crystals for both the monochromator and analyzer, an angular resolution of 1.5 arcsec FWHM was achieved. The efficiency of the grating in all orders up to the 15th was measured using a 12 kW rotating anode X-ray generator. These data provided the basis for a modelling of the grating structure.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Salim Abdali, Finn Erland Christensen, Herbert W. Schnopper, Thomas H. Markert, Daniel Dewey, Christie S. Nelson, "High-resolution x-ray studies of an AXAF high-energy transmission grating", Proc. SPIE 2011, Multilayer and Grazing Incidence X-Ray/EUV Optics II, (1 February 1994); doi: 10.1117/12.167191; https://doi.org/10.1117/12.167191
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KEYWORDS
X-rays

Crystals

Data modeling

X-ray diffraction

Spectrometers

Monochromators

Diffraction gratings

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