1 February 1994 Transmittance measurements for a variety of x-ray/EUV filter materials and pinhole leak measurements utilizing a new visible light photometer system
Author Affiliations +
Abstract
This paper describes a new visible light photometer system and presents the results of a test program where visible light transmission has been measured for a variety of materials of varying thicknesses. From these measurements, equivalent absorption coefficients are presented for some of the materials commonly used in x-ray and extreme ultraviolet filters. Also presented are some criteria for quantifying light leaks through pinholes.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Forbes R. Powell, James Fox, "Transmittance measurements for a variety of x-ray/EUV filter materials and pinhole leak measurements utilizing a new visible light photometer system", Proc. SPIE 2011, Multilayer and Grazing Incidence X-Ray/EUV Optics II, (1 February 1994); doi: 10.1117/12.167214; https://doi.org/10.1117/12.167214
PROCEEDINGS
10 PAGES


SHARE
RELATED CONTENT


Back to Top