Characterization of germanium stripe x-ray lasers

Alan S. Wan; Juan C. Moreno; Brian J. MacGowan; Jeffrey A. Koch; Stephen B. Libby; Joseph Nilsen; Albert L. Osterheld; James H. Scofield; James E. Trebes; Bruno M. Van Wonterghem; Rosemary S. Walling

doi:10.1117/12.167383

1 February 1994 Characterization of germanium stripe x-ray lasers

Alan S. Wan, Juan C. Moreno, Brian J. MacGowan, Jeffrey A. Koch, Stephen B. Libby, Joseph Nilsen, Albert L. Osterheld, James H. Scofield, James E. Trebes, Bruno M. Van Wonterghem, Rosemary S. Walling

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Proceedings Volume 2012, Ultrashort Wavelength Lasers II; (1994) https://doi.org/10.1117/12.167383
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

We will present experimental and theoretical characterizations of germanium line-focused and stripe x-ray lasers (XRLs). Key experimental parameters we will study include images of emission profiles of the laser blow-off, angular divergences, XRL output intensities, and ionization balances as we vary XRL designs. We will compare the experimental results with 2D laser deposition and hydrodynamics simulations using LASNEX, and study the changes in ionization balances and level populations from post-processing LASNEX results.

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Alan S. Wan, Juan C. Moreno, Brian J. MacGowan, Jeffrey A. Koch, Stephen B. Libby, Joseph Nilsen, Albert L. Osterheld, James H. Scofield, James E. Trebes, Bruno M. Van Wonterghem, and Rosemary S. Walling "Characterization of germanium stripe x-ray lasers", Proc. SPIE 2012, Ultrashort Wavelength Lasers II, (1 February 1994); https://doi.org/10.1117/12.167383

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KEYWORDS

Plasma

Germanium

Copper

Cameras

Picosecond phenomena

X-ray lasers

Laser optics

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