1 February 1994 Stigmatic high-resolution high-throughput narrowband diffraction spectrograph employing multilayer mirrors
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Abstract
A novel diffraction spectroscopic instrument comprising two focusing multilayer mirrors (MMs) at near-normal incidence and a conventional blazed plane grating at grazing incidence has been implemented. A nearly perfect stigmatism and a theoretical resolving power above 6 X 104 are due to the separation of the focusing and dispersing functions. For higher throughput, MMs with nearly identical resonance reflection curves around (lambda) 0 approximately equals 135 angstroms have been synthesized employing a magnetron ion sputtering source. The instrument performance has been assessed using a laser-plasma XUV radiation source. The spectral resolution in excess of 4 X 103 and the applicability to space-resolved spectroscopy and plasma diagnosis have been demonstrated.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Eugene N. Ragozin, Eugene N. Ragozin, Nikolai N. Kolachevsky, Nikolai N. Kolachevsky, Mikhail M. Mitropolsky, Mikhail M. Mitropolsky, Anatoli I. Fedorenko, Anatoli I. Fedorenko, V. V. Kondratenko, V. V. Kondratenko, S. A. Yulin, S. A. Yulin, } "Stigmatic high-resolution high-throughput narrowband diffraction spectrograph employing multilayer mirrors", Proc. SPIE 2012, Ultrashort Wavelength Lasers II, (1 February 1994); doi: 10.1117/12.167388; https://doi.org/10.1117/12.167388
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