16 December 1993 Electro-optic characterization of polymeric materials for integrated optics
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Abstract
This contribution deals with the application of some recently developed evanescent wave- optical techniques for the characterization of polymeric thin films as basic structures for integrated optics. Surface plasmon- and guided optical wave-spectroscopies and -microscopies are used to determine the linear and nonlinear optical properties of (chi) (2)-active thin films prepared either by spin-casting from solution or by the Langmuir-Blodgett-Kuhn technique.
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Emil Aust, Emil Aust, Wolfgang Knoll, Wolfgang Knoll, Werner Hickel, Werner Hickel, Harald Knobloch, Harald Knobloch, Horst Orendi, Horst Orendi, } "Electro-optic characterization of polymeric materials for integrated optics", Proc. SPIE 2025, Nonlinear Optical Properties of Organic Materials VI, (16 December 1993); doi: 10.1117/12.165263; https://doi.org/10.1117/12.165263
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