Microstructure of erasable optic disk thin film investigated by STM/AFM

Zhanghua Wu; Fuxi Gan

doi:10.1117/12.150649

13 August 1993 Microstructure of erasable optic disk thin film investigated by STM/AFM

Zhanghua Wu, Fuxi Gan

Proceedings Volume 2053, Optical Storage (ISOS '92); (1993) https://doi.org/10.1117/12.150649
Event: Optical Storage: Third International Symposium, 1992, Kunming, Yunnan Province, China

Abstract

The microstructure of sputtered amorphous magneto-optic media TbFeCo is observed by self- designed scanning tunneling microscopy (STM), and tracks in phase-change media are recorded. GeSbTe is also investigated by atomic force microscopy.

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Zhanghua Wu and Fuxi Gan "Microstructure of erasable optic disk thin film investigated by STM/AFM", Proc. SPIE 2053, Optical Storage (ISOS '92), (13 August 1993); https://doi.org/10.1117/12.150649

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