20 August 1993 Automatic inspection of electronic surface-mount assemblies
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Proceedings Volume 2055, Intelligent Robots and Computer Vision XII: Algorithms and Techniques; (1993) https://doi.org/10.1117/12.150170
Event: Optical Tools for Manufacturing and Advanced Automation, 1993, Boston, MA, United States
Abstract
An approach to image analysis is described consisting of five stages: edge detection, thresholding, linking, shape description and shape abstraction. The approach is illustrated by applying the steps to the problem of automatic inspection.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peter Forte, Peter Forte, Gary P Brown, Gary P Brown, Peter Barnwell, Peter Barnwell, Ron Malyan, Ron Malyan, Paul Netherwood, Paul Netherwood, } "Automatic inspection of electronic surface-mount assemblies", Proc. SPIE 2055, Intelligent Robots and Computer Vision XII: Algorithms and Techniques, (20 August 1993); doi: 10.1117/12.150170; https://doi.org/10.1117/12.150170
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