Automated inspection of bread and loaves

Paper

6 August 1993 Automated inspection of bread and loaves

Bruce G. Batchelor

Author Affiliations +

Proceedings Volume 2064, Machine Vision Applications, Architectures, and Systems Integration II; (1993) https://doi.org/10.1117/12.150278
Event: Optical Tools for Manufacturing and Advanced Automation, 1993, Boston, MA, United States

Abstract

The prospects for building practical automated inspection machines, capable of detecting the following faults in ordinary, everyday loaves are reviewed: (1) foreign bodies, using X-rays, (2) texture changes, using glancing illumination, mathematical morphology and Neural Net learning techniques, and (3) shape deformations, using structured lighting and simple geometry.

© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Bruce G. Batchelor "Automated inspection of bread and loaves", Proc. SPIE 2064, Machine Vision Applications, Architectures, and Systems Integration II, (6 August 1993); https://doi.org/10.1117/12.150278

ACCESS THE FULL ARTICLE

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
11 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

CITATIONS

Cited by 4 scholarly publications.

Explore citations on Lens.org

Advertisement

Advertisement

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

Get copyright permission on Copyright Marketplace

KEYWORDS

X-rays

Inspection

Tin

Cameras

Image processing

Shape analysis

Nonlinear filtering

Show All Keywords

RELATED CONTENT

On-line high-resolution inspection of multilayered plastic bags
Proceedings of SPIE (October 03 1994)

Automated serial number recognition system
Proceedings of SPIE (May 22 2003)

Machine vision inspection of fluorescent lamps
Proceedings of SPIE (March 01 1991)

Machine vision system for surface inspection on brushed industrial parts
Proceedings of SPIE (May 03 2004)

Development of a machine vision system for automotive part inspection
Proceedings of SPIE (February 20 2006)

Flexible multisensor inspection system for solder-joint analysis
Proceedings of SPIE (August 06 1993)

A Practical Solution Using A New Approach To Robot Vision
Proceedings of SPIE (January 09 1984)

Subscribe to Digital Library

Receive Erratum Email Alert