6 August 1993 Coherent object dimension measurement method with the outline images registration on a photodiode array
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Proceedings Volume 2064, Machine Vision Applications, Architectures, and Systems Integration II; (1993) https://doi.org/10.1117/12.150309
Event: Optical Tools for Manufacturing and Advanced Automation, 1993, Boston, MA, United States
Abstract
An optoelectronic moving object linear dimension inspection method is studied. The method is based on the outline image registration with the help of photodiode arrays operating in the signal accumulation mode. A theoretical analysis and experimental test of this method are carried out. Measurement errors of such objects as slit and roller are determined. The degree of object displacement effect on the accuracy of measurement in the measurement region is estimated.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Victor N. Michailov, Victor N. Michailov, I. V. Plechanova, I. V. Plechanova, L. V. Finogenov, L. V. Finogenov, } "Coherent object dimension measurement method with the outline images registration on a photodiode array", Proc. SPIE 2064, Machine Vision Applications, Architectures, and Systems Integration II, (6 August 1993); doi: 10.1117/12.150309; https://doi.org/10.1117/12.150309
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