Translator Disclaimer
6 August 1993 Miniature variable scan camera for machine vision
Author Affiliations +
Proceedings Volume 2064, Machine Vision Applications, Architectures, and Systems Integration II; (1993)
Event: Optical Tools for Manufacturing and Advanced Automation, 1993, Boston, MA, United States
For several years, inspection integrators have had the use of fiberscopes which are employed as borescopes for use in remote inspection applications. However, these are limited to RS170 performance in terms of throughput, sensitivity, and resolution. This paper reports on a new machine vision camera which is small in size (2 inches by 3/4 inches in the image plane) yet offers the resolution and throughput of a variable scan camera. This miniature light weight camera for machine vision can be placed in spaces where physical size and weight are limitations, such as at the end of remote manipulator arms used in automated assembly. A miniature line scan camera using a 1024 pixel line scanner is discussed which has the added feature that video data from multiple remote camera heads can be electronically combined and digitized at a central controller. This permits multiple views of the same object from cameras which can be placed in a space less than 3 cubic inches. This flexibility permits the ease of placement of cameras on the assembly line.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mike Miethig, J. Chris Renn, Brian C. Doody, P. Tom Jenkins, and Rob G. Ambrose "Miniature variable scan camera for machine vision", Proc. SPIE 2064, Machine Vision Applications, Architectures, and Systems Integration II, (6 August 1993);


Optical pipe-scanning system for sewers: RODIAS
Proceedings of SPIE (November 14 1996)
Progressive scan 30-frame-per-second megapixel camera
Proceedings of SPIE (March 14 1995)
High-speed CCD readout camera system
Proceedings of SPIE (October 14 1994)
Miniature variable scan camera for machine vision
Proceedings of SPIE (May 20 1993)

Back to Top