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15 March 1994 Fourier analysis of complex filtering in the transform plane for obtaining nanometric surface profiles
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Proceedings Volume 2065, Optics, Illumination, and Image Sensing for Machine Vision VIII; (1994) https://doi.org/10.1117/12.169358
Event: Optical Tools for Manufacturing and Advanced Automation, 1993, Boston, MA, United States
Abstract
The application of phase complex filtering in the transform plane of an imaging system is investigated, by derivation of analytical relationships between surface profiles and the light intensity produced. This analysis is based upon ideal conditions. In order to investigate the behavior under realistic conditions for pure complex filtering (Phase Contrast), a computer simulation program has been devised. This program is based on the Fresnel approximation of the Kirchhoff-Fresnel diffraction integral. The approximation is implemented by using a Fourier transform equivalent. The effects on filter spot size and surface amplitude are detailed.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jan H. Rakels "Fourier analysis of complex filtering in the transform plane for obtaining nanometric surface profiles", Proc. SPIE 2065, Optics, Illumination, and Image Sensing for Machine Vision VIII, (15 March 1994); https://doi.org/10.1117/12.169358
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