30 December 1993 Rapid mapping of transverse stresses along a highly birefringent optical fiber
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Proceedings Volume 2071, Distributed and Multiplexed Fiber Optic Sensors III; (1993) https://doi.org/10.1117/12.165909
Event: Optical Tools for Manufacturing and Advanced Automation, 1993, Boston, MA, United States
Abstract
A new arrangement is described for mapping transverse stress regions along a highly- birefringent fiber, using the optical Kerr effect in a pump-probe system. This arrangement provides a passively-biased detection system immune from thermal variations in sensitivity and, in principle, enables information to be extracted with only one laser pulse. It also enables real time location of transverse stress points which are moving along the fiber. As the laser sources employed are very compact, this system is potentially easily portable.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ilkan Cokgor, Ilkan Cokgor, Vincent A. Handerek, Vincent A. Handerek, Alan J. Rogers, Alan J. Rogers, } "Rapid mapping of transverse stresses along a highly birefringent optical fiber", Proc. SPIE 2071, Distributed and Multiplexed Fiber Optic Sensors III, (30 December 1993); doi: 10.1117/12.165909; https://doi.org/10.1117/12.165909
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