7 February 1994 Bias of integrated optics Pockels cell high-voltage sensors
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Proceedings Volume 2072, Fiber Optic Physical Sensors in Manufacturing and Transportation; (1994) https://doi.org/10.1117/12.166855
Event: Optical Tools for Manufacturing and Advanced Automation, 1993, Boston, MA, United States
Abstract
The results of measurements of the intrinsic phase-differences of titanium- indiffused lithium niobate waveguides, for use in integrated optics Pockels cell high-voltage sensors, are presented. The dependencies of the intrinsic phase-differences of these waveguides on their lengths and widths are investigated; a change of between 4.9 and 5.9 degree(s)/micrometers /mm was obtained. Also, the change in the intrinsic phase-difference as a function of both temperature and time was investigated; a typical change of 0.02 degree(s)/ degree(s)C/mm was measured and, following a small initial change, the bias was found not to drift with time. Some suggestions for possible post-processing of the output signals, of the integrated optics Pockels cell high-voltage sensors, to increase the dynamic range and to compensate for small changes in the bias, are presented.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nicolas A.F. Jaeger, Nicolas A.F. Jaeger, Farnoosh Rahmatian, Farnoosh Rahmatian, } "Bias of integrated optics Pockels cell high-voltage sensors", Proc. SPIE 2072, Fiber Optic Physical Sensors in Manufacturing and Transportation, (7 February 1994); doi: 10.1117/12.166855; https://doi.org/10.1117/12.166855
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