Polymer/silica optical fiber interfaces studied by atomic force microscopy

Qian Zhong; Daryl Inniss

doi:10.1117/12.168622

1 March 1994 Polymer/silica optical fiber interfaces studied by atomic force microscopy

Qian Zhong, Daryl Inniss

Proceedings Volume 2074, Fiber Optics Reliability and Testing: Benign and Adverse Environments; (1994) https://doi.org/10.1117/12.168622
Event: Optical Tools for Manufacturing and Advanced Automation, 1993, Boston, MA, United States

Abstract

An atomic force microscope (AFM), operated in both contact and tapping mode, was used to study fractured polymer/silica optical fiber interfaces. The polymer coating was separated from the fiber either by pulling the fiber out of the coating or via delamination through immersing the coated fiber in an organic solvent. The fracture surfaces were analyzed by comparing the resultant surface topography with the polymer removal procedures. The AFM analyses suggest that the fracture process is sensitive to the cohesive properties of the polymer, as well as the adhesive bond strength of the interface. We demonstrate the utility of an AFM to study adhesion of viscoelastic polymers to silica surfaces.

Citation Download Citation

Qian Zhong and Daryl Inniss "Polymer/silica optical fiber interfaces studied by atomic force microscopy", Proc. SPIE 2074, Fiber Optics Reliability and Testing: Benign and Adverse Environments, (1 March 1994); https://doi.org/10.1117/12.168622

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