Depth profiling with step-scan FTIR photoacoustic spectroscopy

John F. McClelland; Roger W. Jones; S. Ochiai

doi:10.1117/12.166579

31 January 1994 Depth profiling with step-scan FTIR photoacoustic spectroscopy

John F. McClelland, Roger W. Jones, S. Ochiai

Proceedings Volume 2089, 9th International Conference on Fourier Transform Spectroscopy; (1994) https://doi.org/10.1117/12.166579
Event: Fourier Transform Spectroscopy: Ninth International Conference, 1993, Calgary, Canada

Abstract

Recent advances in FT-IR spectrometers provide an extended modulation frequency range and phase modulation. Depth dependent information can now be obtained over a wider range by both modulation frequency variation and phase difference analysis.

Citation Download Citation

John F. McClelland, Roger W. Jones, and S. Ochiai "Depth profiling with step-scan FTIR photoacoustic spectroscopy", Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); https://doi.org/10.1117/12.166579

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