Paper
31 January 1994 Environment-resistant infrared support
Jack H. Hartshorn
Author Affiliations +
Proceedings Volume 2089, 9th International Conference on Fourier Transform Spectroscopy; (1994) https://doi.org/10.1117/12.166660
Event: Fourier Transform Spectroscopy: Ninth International Conference, 1993, Calgary, Canada
Abstract
Traditional Infrared sample supports are very moisture and/or light sensitive. Thus, this technique has been used little for investigating the effects of weathering and outdoor exposure on polymeric products and organic materials. Amorphous silicon is extremely chemically resistant and its electronic grade is infrared transparent in thin sheets. Properly polished, we have used silicon wafers for many years to evaluate coatings exposed in south Florida and to determine their mode of degradation under accelerated environmental conditions.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jack H. Hartshorn "Environment-resistant infrared support", Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); https://doi.org/10.1117/12.166660
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KEYWORDS
Infrared radiation

Polishing

Semiconducting wafers

Silicon

Organic materials

Polymers

Amorphous silicon

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