Paper
31 January 1994 Fourier transform infrared-attenuated total reflection studies of surfactant adsorption at the solid/liquid interface
N. Simon Nunn, Jack Yarwood, Paul A. Stevenson, W. David Cooper
Author Affiliations +
Proceedings Volume 2089, 9th International Conference on Fourier Transform Spectroscopy; (1994) https://doi.org/10.1117/12.166689
Event: Fourier Transform Spectroscopy: Ninth International Conference, 1993, Calgary, Canada
Abstract
Fourier transform infrared-attenuated total reflection (FTIR-ATR) spectroscopy has been employed to study surfactant adsorption in situ at the solid/liquid interface. Specifically, the adsorption of amine and sorbitan ester based surfactants from deuterated toluene onto the native silicon oxide layer on an Si ATR prism has been investigated. Quantitative analysis of the spectra has enabled the Gibbs surface excess concentration to be calculated and hence adsorption isotherms to be constructed for each surfactant. The orientation of the aliphatic chains in the adsorbed layer has been determined using polarized FTIR-ATR spectroscopy.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
N. Simon Nunn, Jack Yarwood, Paul A. Stevenson, and W. David Cooper "Fourier transform infrared-attenuated total reflection studies of surfactant adsorption at the solid/liquid interface", Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); https://doi.org/10.1117/12.166689
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Adsorption

Interfaces

Prisms

Silicon

Spectroscopy

Molecules

Reflectance spectroscopy

Back to Top