31 January 1994 Fourier transform infrared-attenuated total reflection studies of surfactant adsorption at the solid/liquid interface
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Proceedings Volume 2089, 9th International Conference on Fourier Transform Spectroscopy; (1994) https://doi.org/10.1117/12.166689
Event: Fourier Transform Spectroscopy: Ninth International Conference, 1993, Calgary, Canada
Abstract
Fourier transform infrared-attenuated total reflection (FTIR-ATR) spectroscopy has been employed to study surfactant adsorption in situ at the solid/liquid interface. Specifically, the adsorption of amine and sorbitan ester based surfactants from deuterated toluene onto the native silicon oxide layer on an Si ATR prism has been investigated. Quantitative analysis of the spectra has enabled the Gibbs surface excess concentration to be calculated and hence adsorption isotherms to be constructed for each surfactant. The orientation of the aliphatic chains in the adsorbed layer has been determined using polarized FTIR-ATR spectroscopy.
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N. Simon Nunn, N. Simon Nunn, Jack Yarwood, Jack Yarwood, Paul A. Stevenson, Paul A. Stevenson, W. David Cooper, W. David Cooper, } "Fourier transform infrared-attenuated total reflection studies of surfactant adsorption at the solid/liquid interface", Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); doi: 10.1117/12.166689; https://doi.org/10.1117/12.166689
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