31 January 1994 In situ identification of high-performance thin-layer chromatography spots by fourier transform surface-enhanced Raman scattering
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Proceedings Volume 2089, 9th International Conference on Fourier Transform Spectroscopy; (1994) https://doi.org/10.1117/12.166580
Event: Fourier Transform Spectroscopy: Ninth International Conference, 1993, Calgary, Canada
Abstract
FT-SERS has been used to identify samples supported on high-performance thin-layer chromatography plates. The TLC plates were sprayed with colloidal silver solutions which resulted in enhancement of the FT-Raman scattering of these biologically and environmentally important compounds.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Eckhardt Koglin, Hella Kramer, Juergen Sawatski, Carolin Lehner, Janice L. Hellman, "In situ identification of high-performance thin-layer chromatography spots by fourier transform surface-enhanced Raman scattering", Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); doi: 10.1117/12.166580; https://doi.org/10.1117/12.166580
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